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Wired Communications

Accelerate PCIe, SAS and SATA testing with a single test solution including automation and debug capabilities. Speed up your 400G product development with PAM4 testing to efficiently validate your technology advances. Get to compliance faster with your Type-C devices.


400G PAM4 Testing

  • Optical Manufacturing Tests for 400G
  • Accelerate 400G product development
  • Validate faster and increase yield

Coherent Optical

  • No more trial and error
  • Automate to reduce calibration times and measure accurately

Test and Debug

  • Automate calibration
  • Close the loop on loopback debug
  • Superior signal integrity and debug

Consumer Standards Over Type-C

  • Get to compliance faster for next gen USB, DisplayPort, HDMI
  • Build confidence on the margin of devices
  • Avoid expensive overdesigning

More applications in Wired Communications:

Trends in Wired Communications

Connected devices and the type of data we consume are changing the ways we access, store and move data. Read more about the broad trends shaping the datacenter and wired communications market.

"That’s hot data you need to get quickly. I think we’re also going to see more smaller datacenters that are closer to the point of service."

Sarah Boen, Tektronix

Read More
PCIe Gen 5 Tx Tech Brief
Get an overview of PCI Express 5.0, testing, the challenges associated with that, and learn about the Tektronix PCIe 5.0 Transmitter Test Solution.
PCI Express Gen 5 Reference Clock Webinar
This webinar presents an overview of reference clock jitter requirements as they have evolved and offers techniques for making these low femtosecond measurements using a real time oscilloscope. 
PCI Express Gen 5 Update Webinar
Cloud-based computing power, storage capacity, and network bandwidth have led to the development of the PCI Express 5.0 specification for 32.0 GT/s. This webinar starts with an overview of 5.0 …
Addressing PCIe Gen1-5 Test and Debug Challenges with Confidence
Learn how to address the test and measurement challenges posed by PCIE Gen1-5 for both base silicon testing and CEM compliance testing. Gain insights and solutions for automation, validation, and …
Solving 400G Data Center Interconnect Measurement Challenges
This webinar will equip you to address the challenges posed by the forthcoming interoperability standards. OIF standards for interoperability of 400G coherent links for Data Center Interconnects (DCI) …