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I-V Curve Tracer Configurations

Developing and using MOSFETS, IGBTs, diodes and other high-power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. While I-V curve tracer software supports testing two-terminal devices on graphical SMUs, Keithley also offers high-power Parametric Curve Tracer configurations to support the full spectrum of device types and test parameters. These configurations more closely mimic the old Tektronix I-V curve tracers.

Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly. These configurations are also modular, so they can be upgraded in the future and the individual instruments like source measure units can be used for other applications.

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Base Price
US $26,200 +
Keithley PCT Parametric Curve Tracer Configurations

I-V curve tracer configuration features

  • Complete solutions engineered for optimum price and performance
  • Field upgradable and reconfigurable -- convert your your curve tracer to a reliability or wafer sort tester
  • Configurable power levels:
    • From 200V to 3kV
    • From 1A to 100A
  • Wide dynamic range:
    • From µV to 3kV
    • From fA to 100A
  • Full range of capacitance-voltage (C-V) capability:
    • fF to µF
    • Supports 2-, 3-, and 4-terminal devices
    • Up to 3kV DC bias
  • High performance test fixture supports a range of package types
  • Probe station interface supports most probe types including HV triax, SHV coax, standard triax, and others
Model Description High Voltage Mode High Current Mode List Price Configure And Quote
2600-PCT-1B

Low Power

200 V/10 A 200 V/10 A US $26,200 Configure & Quote
2600-PCT-2B

High Current

200 V/10 A 40 V/50 A US $54,100 Configure & Quote
2600-PCT-3B

High Voltage

3 kV/120 mA 200 V/10 A US $61,000 Configure & Quote
2600-PCT-4B

High Current and High Voltage

3 kV/120 mA 40 V/50 A US $90,000 Configure & Quote
Model Description High Voltage Mode High Current Mode List Price Configure And Quote
2600-PCT-1B

Low Power

200 V/10 A 200 V/10 A US $26,200 Configure & Quote
2600-PCT-2B

High Current

200 V/10 A 40 V/50 A US $54,100 Configure & Quote
2600-PCT-3B

High Voltage

3 kV/120 mA 200 V/10 A US $61,000 Configure & Quote
2600-PCT-4B

High Current and High Voltage

3 kV/120 mA 40 V/50 A US $90,000 Configure & Quote
Accessory 8010
Datasheet Description
TEST FIXTURE FOR 265xA
Accessory HV-CA-554-.5
Datasheet Description
HV TRIAX CABLE, 0.5 M, MALE TO MALE
Accessory HV-CA-554-1
Datasheet Description
HV TRIAX CABLE, 1 M, MALE TO MALE
Accessory HV-CA-554-2
Datasheet Description
HV TRIAX CABLE, 2 M, MALE TO MALE
Accessory HV-CA-554-3
Datasheet Description
HV TRIAX CABLE, 3 M, MALE TO MALE
Accessory HV-CS-1613
Datasheet Description
HV TRIAX FEMALE FEEDTHROUGH CONN
Accessory PCT-CVU
Datasheet Description
MULTIFREQUENCY CV METER FOR PCT
Datasheet Accessory Description
View Datasheet 8010 TEST FIXTURE FOR 265xA
View Datasheet HV-CA-554-.5 HV TRIAX CABLE, 0.5 M, MALE TO MALE
View Datasheet HV-CA-554-1 HV TRIAX CABLE, 1 M, MALE TO MALE
View Datasheet HV-CA-554-2 HV TRIAX CABLE, 2 M, MALE TO MALE
View Datasheet HV-CA-554-3 HV TRIAX CABLE, 3 M, MALE TO MALE
View Datasheet HV-CS-1613 HV TRIAX FEMALE FEEDTHROUGH CONN
View Datasheet PCT-CVU MULTIFREQUENCY CV METER FOR PCT

I-V curve tracer FAQs

What is I-V curve tracing?

I-V curve tracing is the process of analyzing current-voltage (I-V) characteristics of semiconductor devices for failure analysis and parametric characterization.

What does a curve tracer do?

A curve tracer is an electronic test device used to perform I-V curve tracing and analyze the characteristics of semiconductor devices such as diodes, transistors, and thyristors. Though curve tracers aren’t generally sold today, engineers can use I-V curve tracer software and other instruments on their bench to run the same tests as a curve tracer.

How does an I-V curve tracer work?

I-V curve tracers or I-V curve tracer configurations operate by varying a parameter, then measuring a separate parameter to produce data for analysis.