Keithley Automated Characterization Suite (ACS) Software
Flexibility with Programming Preferences for Characterization Applications
ACS features Script Editor, an independent tool with graphical user interface for developing Python code and TSP® scripts for performing instrumentation control, data analysis, and system automation. It offers intuitive ways to create and develop GUI design and manage user libraries and modules.
Automate Your Data Gathering Processes
The wafer prober automation option for ACS makes it easy to interface a variety of popular semi- or fully-automatic wafer probe stations into your test setup to capture large amounts of data quickly. This option includes a wafer description utility, real-time wafer maps with binning capabilities, a cassette sample plan utility, and a post-test cassette and wafer review utility. Many of the tools and capabilities built into ACS enhance automated device characterization.
Share Test Projects and Results
ACS offers a common set of key elements that work across a wide range of hardware configurations, reducing time and increasing productivity. Systems perform consistently from one hardware implementation to another, so, for example, it’s easy to transfer your knowledge of an ACS-based system used in single-device component characterization to another designed for wafer level testing.
Maximize the Productivity of Your Keithley Hardware
The tools in ACS simplify test development and maximize the speed of each Keithley instrument linked into the system. Together, ACS and Keithley TSP-based hardware offer the highest throughput in the industry to lower the cost of test without requiring you to spend time learning new programming concepts or languages before getting the data needed to accomplish your goals.
ACS Basic Edition is primarily for semiconductor component testing with manual probe stations or test fixtures. Perform initial device characterization quickly and interactively with “Trace Mode.” Or create detailed parameter extraction tests using the GUI-based set-up screen and extensive measurement libraries.
Configure & Quote
ACS supports a wide range of semi-automatic and fully automatic probers for semiconductor device measurements across an entire wafer. Or control the prober interactively for testing individual devices. Monitor testing progress with individual device results and multi-device statistics during run-time.
Configure & Quote
Applications from Lab to Fab
ACS-based Integrated Test Systems are complete solutions for applications such as parametric die sort, high power semiconductor component characterization, and wafer level reliability testing. When paired with appropriate semi-automatic and fully-automatic probe stations, their hardware configurations and test project development can be easily optimized for specific tasks.
Power Sequencing for GaN HEMT I-V Characterization
Because of its “normally-on” characteristic, GaN HEMT requires a specific power sequence during I-V characterization. ACS Software supports power sequencing for GaN HEMT characterization of a device without damaging it to capture its intrinsic I-V characteristics.
|Description Datasheet||ACS-2600-RTM||RELIABILITY TEST OPTION TO ACS|