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Keithley High Resistance/Low Current Electrometers Series 6500, 6430
Choose from three sensitive options for precision high resistance and low current measurements. The 5½-digit Model 6514 and Model 6517B Electrometers offer 1fA sensitivity, >200TΩ input impedance on voltage measurements, and charge measurements down to 10fC. The 6½-digit Model 6430 Sub-Femtoamp Remote SourceMeter SMU Instrument can measure current with 1aA sensitivity. Its low noise and drift performance make it ideal for research on single electron devices, highly resistive nanowires and nanotubes, polymers, and electrochemical applications.
Keithley High Resistance/Low Current Electrometers Series 6500, 6430
Features |
Benefits |
| Extremely low noise (0.4fAp-p for 6430, <1fA for 6517B and 6514) | Ensures more accurate measurements of the extremely low currents common in device and materials research. |
| Resistance measurements up to 1016Ω (6517B) | Measures resistance on ultra-high resistance materials and insulators accurately. |
| Remote PreAmp can be located at the signal source (6430) | Allows making a direct or very short connection to the signal source, minimizing noise sources such as cable noise. |
| Low burden voltage | Eliminates errors that affect the accuracy of low current measurements. |
| Built-in ±1kV voltage source with sweep capability (6517B) | Simplifies performing leakage, breakdown, and resistance testing, as well as volume (Ω-cm) and surface resistivity (Ω/square) measurements on high resistivity materials. |
| Optional Model 8009 Resistivity Chamber for measuring volume and surface resistivities of sample materials (6517B) | Protects you from contact with potentially hazardous voltages —opening the lid of the chamber automatically turns off the instrument’s voltage source. |
| High measurement speeds even on low-level signals | Allows faster low-level component testing. |
| Programmable digital I/O and built-in interfaces | Simplifies building automated component test systems. |
Datasheet
1681
Datasheet
Accessory
CLIP-ON TEST LEADS
Datasheet
237-ALG-2
Datasheet
Accessory
LOW NOISE TRIAX CABLE
Datasheet
237-BNC-TRX
Datasheet
Accessory
2-SLOT M BNC TO 3 LUG F TRIAX
Datasheet
237-TRX-NG
Datasheet
Accessory
TRIAX 3S M/3L F GRD DISC
Datasheet
4288-1
Datasheet
Accessory
SINGLE FIXED RACK MOUNTING KIT
Datasheet
4288-2
Datasheet
Accessory
DUAL FIXED RACK MOUNTING KIT
Datasheet
4804
Datasheet
Accessory
MALE BNC TO FEMALE TRIAX ADAPT
Datasheet
6517B-ILC-3
Datasheet
Accessory
INTERLOCK CABLE
Datasheet
6517-ILC-3
Datasheet
Accessory
INTERLOCK CABLE, 4 PIN
Datasheet
6517-TP
Datasheet
Accessory
TEMPERATURE PROBE
Datasheet
6521.
Datasheet
Accessory
SCANNER CARD
Datasheet
7009-5
Datasheet
Accessory
5 FT. SHIELDED RS-232 CABLE
Datasheet
8009
Datasheet
Accessory
RESISTIVITY TEST FIXTURE
| Datasheet | Datasheet | Accessory |
|---|---|---|
| Description Datasheet | 1681 | CLIP-ON TEST LEADS |
| Description Datasheet | 237-ALG-2 | LOW NOISE TRIAX CABLE |
| Description Datasheet | 237-BNC-TRX | 2-SLOT M BNC TO 3 LUG F TRIAX |
| Description Datasheet | 237-TRX-NG | TRIAX 3S M/3L F GRD DISC |
| Description Datasheet | 4288-1 | SINGLE FIXED RACK MOUNTING KIT |
| Description Datasheet | 4288-2 | DUAL FIXED RACK MOUNTING KIT |
| Description Datasheet | 4804 | MALE BNC TO FEMALE TRIAX ADAPT |
| Description Datasheet | 6517B-ILC-3 | INTERLOCK CABLE |
| Description Datasheet | 6517-ILC-3 | INTERLOCK CABLE, 4 PIN |
| Description Datasheet | 6517-TP | TEMPERATURE PROBE |
| Description Datasheet | 6521. | SCANNER CARD |
| Description Datasheet | 7009-5 | 5 FT. SHIELDED RS-232 CABLE |
| Description Datasheet | 8009 | RESISTIVITY TEST FIXTURE |
Control your instruments from your PC
Drive innovation through faster test & measurement with KickStart Software. KickStart instrument control software for the PC enables quick test setup, text execution and data visualization. By plotting data immediately and offering quick statistical summaries of the data in the reading table, KickStart allows you to gather insights faster and make the decisions you need to make.
- Run tests on multiple types of bench instruments independently or simultaneously
- Auto export data for long term logging
- Replicate tests quickly using saved test configurations
- Use built-in plotting, comparison and statistical tools to quickly discover measurement anomalies and trends
- Configure tests using simulated instruments and swap in real instruments when available