High Speed Serial Communications

High-speed digital standards are quickly evolving to support the performance demands of our data driven world. Next generation serial standards and data communication requirements are bringing new test challenges, pushing the limits of today’s compliance and debug tools. From design and simulation, analysis, debug, and compliance testing, Tektronix provides advanced, automated measurement solutions to optimize performance, speed up validation cycles and accelerate time-to-market.

SERIAL STANDARDS

DisplayPort

DDR

Ethernet

HDMI

MIPI

PCI Express (PCIe)

SAS/SATA

Thunderbolt

USB

ADVANCED MEASUREMENTS

Jitter Measurement and Timing Analysis

Serial Data Link Analysis (SDLA)

Signal Integrity

Featured Content

Accelerate PCIe, SAS, SATA Test and Debug

Keeping pace with the next generation of data rates and storage standards requires end-to-end solutions that can scale to 32Gb/s while providing current-gen capabilities.

Discover how to accelerate your design testing and debug.

Learn More

Consumer Standards over Type-C

The Type-C connector provides consolidation of consumer standards USB 3.1, DisplayPort 1.4, and Thunderbolt. This translates to new design challenges making it difficult to keep design costs low while maintaining optimal electrical margins on your products.

Discover how to tackle these new challenges.

Learn More

e-Guide to High Speed Interface Standards

This FREE e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. You get quick access to technical resources that will help you understand design challenges and pick the right solution for your test needs.

Download Now

Enter email:

Please enter a valid email address.

Your email has been sent.

Reset

Library

Title
PCI Express® Transmitter PLL Testing — A Comparison of Methods There are several methods of measuring PLL loop response, based on the type of test instrumentation used. As expected, the various methods trade off test accuracy, test speed (throughput), ease of …
Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces. Included is a test and …
PCIe Gen 5 Tx Tech Brief Get an overview of PCI Express 5.0, testing, the challenges associated with that, and learn about the Tektronix PCIe 5.0 Transmitter Test Solution.
High Speed Interface Standards This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical …
Fast+ Efficient Solutions for DVI Conformance Measurement Challenges Tektronix provides all the DVI measurement solutions you need, ranging from high-bandwidth digital phosphor oscilloscopes (DPO) to probes to application-specific software. Tektronix has solved tough …
Remote Head Acquisition Improves High Speed Serial Measurement As high speed serial data rates continue to increase, the need to maximize margin in measurements increases. Coaxial cables, even good quality ones can impact the measurement margin. Remote heads for …
Probing Tips for High Performance Design and Measurement When a high performance system or component needs to be verified, it often requires attaching an oscilloscope probe. For high speed circuits, the effect of attaching a probe often cannot be ignored …

Title
DDR5 Memory Characterization While they promise to provide datacenters with large amounts of data at faster speeds and lower power consumption, DDR5 memory devices have unique test challenges. Learn about characterization and …
PCIe Gen5 to Gen6 and Comparison to Electrical Ethernet Watch as David Bouse explains the evolution of PCI Express from Gen5 to Gen6. Then hear from Pavel Zivny as he and David discuss PAM4 signaling in PCIe and how it compares with PAM4 as applied in …
USB4 Webinar View our USB4 Compliance and Characterization Test webinar to learn how you can address the measurement challenges associated with the new USB4 standard.
PCI Express Gen 5 Reference Clock Webinar This webinar presents an overview of reference clock jitter requirements as they have evolved and offers techniques for making these low femtosecond measurements using a real time oscilloscope.
DDR5 Test Challenges Webinar Learn how you can address five of the thorniest measurement challenges associated with the new DDR5 standard. Get an update on the DDR5 Rx/Tx compliance test and insight in the latest characterization …
PCI Express Gen 5 Update Webinar Cloud-based computing power, storage capacity, and network bandwidth have led to the development of the PCI Express 5.0 specification for 32.0 GT/s. This webinar starts with an overview of 5.0 …
How to Address Your Toughest Serial Bus Design Challenges with EDA and Measurement Correlation This Tektronix webinar will teach engineers how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using the DPO/MSO70000 Series …
Demystify MIPI D-PHY and C-PHY Transmitter and Receiver Physical Layer Test During this webinar, you'll gain an understanding of MIPI test challenges for both MIPI high-speed physical layers. You'll also get useful tips and technical insights into characterizing and …