11:00 AM (GMT+8)
Wide Band-gap (WBG) power devices (SiC and GaN) offer significant benefits over silicon based power devices. WBG Semiconductors play a big role in the future of power devices. They are smaller, faster and more efficient than their silicon counterpart. But they also present several validation test challenges.
In this session, we will talk about the wide bandgap test challenges, measurement techniques, and test equipment needs including the requirements for a scope, probing techniques, and automated test software that can help meet the tough challenges presented by wide bandgap semiconductor devices.