This webinar presents a new technique that makes characterization and parameter extraction easier and quicker. We'll discuss parameter extraction and which tests will give you the most information about your device. Register today and learn how to:
- Characterize both AC and DC properties of a MOS device
- Perform I-V and C-V measurements correctly the first time
- Switch between DC and AC measurements quickly and easily
Sign up to attend this live event. After the presentation, you'll be able to ask the speaker questions specific to your application. Can't attend? You'll also receive a link to the recorded webinar after the broadcast date.