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“There’s a lot of inspiration among
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Pat Byrne – Tektronix President
We celebrate this Age of the Engineer. Our experts will help you frame the future. With regular updates on applications and technology trends to achieve measurement insight, Tektronix will boost your productivity and accelerate your time to market.
As always-on devices proliferate, power efficiency becomes an increasingly critical design consideration. Ensure safe, precise and fast Si, SiC and GaN MOSFET testing in a lab and wafer test environment. Learn more about the testing challenges resulting from the adoption of SiC and GaN into your designs and how to solve them. Discover how to minimize power draw and maximize battery life for your end-products. Accelerate the time-to-market for your designs.
As data rates increase, get the measurement insight to get ahead. Accelerate PCIe, SAS, SATA Compliance Testing with a single test solution including automation and debug capabilities. Speed up your 400G product development with PAM4 testing to efficiently validate your technology advances. Get to compliance faster with your Type-C devices.
Next Gen Media
Simplify your 4K HDR Video test and monitoring. Get true visibility into your cloud video delivery network for more efficient quality control and compliance. Close the knowledge gap between SDI and IP worlds and foster collaboration between broadcast engineers and IT experts. Accelerate your video delivery or creation evolution with the most robust test and monitoring tool sets in the industry.
Get the insight and tools to test confidently in today’s world of advanced automotive electronics. Speed through validation, debugging and compliance testing your Automotive Ethernet PHY design. Reduce ECU validation and debug time with automated protocol analysis of important standards like CAN and CAN FD.
Accurately simulate threat radar in operational environments while measuring ECM Techniques. Utilize powerful DSP technology to characterize spectrum and identify signals of interest. Integrate, scale and deploy low Swap, high fidelity RF sensors to characterize spectrum. Ensure complex modulation techniques used in Satcom systems are low in bit error rate and provide secure, reliable communications.
Many depth sensing technologies use structured light or Time of Flight (ToF). Learn more about Laser Diode Array Test for 3D Sensing and also about enhancing Trigger Synchronization for High Volume Production Testing of VCSELs.