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Power Semiconductor Device Testing

From the early stages of design to the point when it’s ready for market, a new power device undergoes a gamut of test and characterization activities, and you face many steps in bringing that device to market, including:

Get our e-Guide and learn how to overcome the challenges posed by each stage of the power semi device life cycle.


IsoVu Generation 2 Technology White Paper
This white paper describes the theory of operation and performance capabilities of an optically isolated measurement system that offers complete galvanic isolation to accurately resolve high bandwidth …
Creating Multi-SMU Systems with High Power System SourceMeter Instruments Application Note
Double Pulse Test with the Tektronix AFG31000 Arbitrary Function Generator
This application note describes how to set up and run a double pulse test using the built-in software on the Tektronix AFG31000 Arbitrary Function Generator. Now you do not need to spend time creating …
Measuring Vgs on Wide Bandgap Semiconductors
This application note shows a procedure for achieving accurate measurements of gate-to-source voltage on high-side (ungrounded) FETs using the IsoVu measurement system. 
Protecting Parametric Test Systems and the Test Environment from Damaging Transient Overvoltages and Overcurrents
Measuring breakdown parameters is increasingly required to predict a device’s safe region of operation. Sometimes, those breakdown conditions in reliability testing and breakdown test occur as a …
Achieving Fast Pulse Measurements for Today's High Power Devices - Application Brief
Testing to 100A by Combining Keithley Model 2651A High Power SourceMeter Instruments (Application Brief)
Testing to 100A by Combining Keithley Model 2651A High Power SourceMeter Instruments (Application Note)
Simplify Component Selection with Robust DC Characterization
Watch this webinar to get tips for measuring 2- and 3-terminal semiconductor devices and for using source measure unit instruments during the design process.